• Basic Questions to Answer:

• What is Testing?

• What is VLSI Testing?

• Why VLSI Testing?

• How VLSI Testing Done?

Standard VLSI Devices:
Logic families:

• A group of logic gates that are constructed using one of the several designs usually with
compatible power supply characteristics and logic levels.

Set of technologies used to implement VLSI circuits.

• Some of the Logic Technologies are;

1. Resistor-Transistor Logic(RTL).

2. Diode-Transistor Logic(DTL).

3. Emitter-Coupled Logic(ECL).

4. Transistor-Transistor Logic(TTL).

5. Complementary MOS Logic(CMOS).

Resistor-Transistor Logic(1961):
• Built Using resistors as the input network and BJTs as the
switching devices.

• Advantages:
• Minimum number of transistors.

• Disadvantages:
1. Cannot switch at higher speeds.
2. High current dissipation.

Diode-Transistor Logic(1962):
• Logic gating function by diode network and amplifying function
by transistor network.

• Advantage:
• Increased Fan-in.
Emitter-Coupled Logic(1962):
• ECL uses an overdriven BJT differential amplifier with single-ended input and limited
emitter current to avoid the saturated (fully on) region of operation and its slow turn-off
behavior.

• Advantages:
1. High-speed.
2. High Fan-in.

• Disadvantages:
• Requires more power.

Transistor-Transistor Logic(1964):
• Built from BJTs.
• Transistors perform both logic function and amplifying function.

• Advantages:
1. Low cost.
2. Ease of use.

• Disadvantages:
1. More power consumption at high frequencies.
2. Limited speed.
3. Noisy.
CMOS Logic(1968):
• CMOS logic gates use complementary arrangements of enhancement-mode N-channel
and P-channel field effect transistor.
Advantages:
1. Less power consumption.
2. Less noise.
3. Good Fanout.
Disadvantages:
• Worst propagation delay.
Datasheet:
• Summarises the performance and technical characteristics of a digital device.
• Specifies the various parameters need to be tested with test conditions.
• Decides the product or design.
• Consists of overview of a device, features, architecture details, pin diagram, Absolute
maximum ratings, Recommended operating conditions, DC Characteristics and AC
Characteristics etc.
Various parameters of a VLSI digital device:

• The datasheet of a particular digital device consists of certain parameters that need to be
tested to decide pass/fail test.

1. VDD – Power supply voltage.

2. VIN- Input voltage.
3. TA- Ambient temperature.
4. VIL- low level input voltage.
VIL- Less than 0.8V.
5. VIH- High level input voltage.
VIH- Greater than 2.0V.
6. VOL- Low level output voltage.
VOL- Less than 0.4V.
7. VOH- High level output voltage.
VOH- Greater than 2.4V.
8. IOL- Low level output current.
9. IOH- High level output current.
10. IIL- Low level input current.
11. IIH- High level input current.
12. IOS- Output short circuit current.
13. ICCL- Supply currents with outputs low.
14. ICCH- Supply currents with outputs high.
15. 𝑡𝑝𝐻𝐿 - Propagation delay from high to low.
16. 𝑡𝑝𝐿𝐻 - Propagation delay from low to high.

• The operating parameters of the VLSI digital device are divided into several
sections.

1. Absolute Maximum Ratings:

• Maximum limits of temperature, current, voltage which may be applied to the
device.

• If any limits are violated, then the device will fail.

2 Recommended operating conditions:
• These are the operating conditions that device tends to operate.

• Commercial and military conditions.

• Commercial devices range of VDD is 5V±5%.

• Military devices range of VDD is 5V±10%.

• The parameters are VCC, VIH, VIL, IOH, IOL, TA.

3 DC characteristics:
• The parameters in this section are VOH, VOL, IIH, IIL, IOS, ICCH, ICCLetc.
• This section contain parameter names, brief description of that parameter, test
conditions that are applied to the parameter, min and max limts, units of
measured parameter.
4 AC charateristics:
• This section consists of timing diagrams and individual parameters
associated with timing diagrams.
• This section also defines waveform characteristics of input signals.
• Functional timing within the test program.
• Parameters include tpHL, tpLH etc.
 Test methodology and Ideology
1. Test system:
• Test system is a electronic and mechanical hardware.
• It is a collection of power supplies, signal generators, meters, waveform
generators and other hardware that are collectively works under one main
computer.
• It is often known as ATE.

2. Test conditions:
• Test conditions are the conditions that may be used to test the parameter.
• To test any individual parameter the conditions are specified in datasheet to
verify the parameters.
• Minimum and Maximum values are specified with respect to that
conditions.
3. Testing method:
• Consider an example of testing the parameter VOH.

• Step1: Preconditioning the output to logic 1.

• Step2: Forcing the current of -5.2mA.
• Step3: Measuring the corresponding voltage.
• Step4: If the measured value is within the specified value then the test is pass
otherwise fail.
 Familiarity with PXIe system and role of PXIe in VLSI testing

• PXI technology is widely used with test instrumentation and data acquisition to
enable the control and automation of testing and data monitoring.
• It successfully combines rugged mechanical elements with a high electrical
performance specification and a low cost.
• Using standard PC technology, this makes PXI an ideal platform for a host of
applications.
• PXI is based on the popular PC based bus system, CompactPCI, used for
embedded development and computer based platforms As such PXI is able
provide the benefits of the PCI architecture: high level of performance, industry
acceptance, wide availability of off the shelf units, etc.