target is prepared from a thin n-type silicon wafer instead of deposited layers on the glass faceplate. The final result is an array of silicon photodiodes for the target plate. Figure shows constructional details of such a target. As shown there, one side of the substrate (n-type silicon) is oxidized to form a film of silicon dioxide (SiO 2 ) which is an insulator. Then by photo masking and etching processes, an array of fine openings is made in the oxide layer. These openings are used as a diffusion mask for producing corresponding number of individual photodiodes.
Boron, as a dopant is vaporized through the array of holes, forming
islands of p-type silicon on one side of the n-type silicon substrate. Finally a very thin layer of gold is deposited on each p-type opening to form contacts for signal output.
The other side of the substrate is given an antireflection coating. The
resulting p-n photodiodes are about 8 μm in diameter. The silicon target plate thus formed is typically 0.003 cm thick, 1.5 cm square having an array of 540 × 540 photodiodes. This target plate is mounted in a vidicon type of camera tube. Scanning and Operation The photodiodes are reverse biased by applying +10 V or so to the n + layer on the substrate. This side is illuminated by the light focused on to it from the image. The incidence of light generates electron-hole pairs in the substrate. Under influence of the applied electric field, holes are swept over to the ‘p’ side of the depletion region thus reducing reverse bias on the diodes. This process continues to produce storage action till the scanning beam of electron gun scans the photodiode side of the substrate. The scanning beam deposits electrons on the p-side thus returning the diodes to their original reverse bias.
The consequent sudden increase in current across each
diode caused by the scanning beam represents the video signal. The current flows through a load resistance in the battery circuit and develops a video signal proportional to the intensity of light falling on the array of photodiodes. A typical value of peak signal current is 7 μA for bright white light. The vidicon employing such a multi diode silicon target is less susceptible to damage or burns due to excessive high lights. It also has low lag time and high sensitivity to visible light which can be extended to the infrared region.
A particular make of such a vidicon has the trade name of
‘Epicon’. Such camera tub es have wide applications in industrial, educational and CCTV (closed circuit television) services. The operation of solid state image scanners is based on the functioning of charge coupled devices (CCDs) which is a new concept in metal-oxide-semiconductor (MOS) circuitry. The CCD may be thought of to be a shift register formed by a string of very closely spaced MOS capacitors. It can store and transfer analog charge signals—either electrons or holes—that may be introduced electrically or optically. The scanning systems so far proposed for solid-state image pickup devices may be classified into two types. One type is based on the combination of a photodiode matrix and tapped delay circuits connected to a pulse source, while the other type comprises a combination of a photodiode array and a bleeder coupled to a scanning saw tooth voltage source. In the former, a great number of active and passive circuit elements are required, with the result that the device is complicated in structure and difficult and costly to manufacture, and has the further undesirable characteristics of insufficient reliability and low useful life. The constructional details and the manner in which storing and transferring of charge occurs is illustrated in Figure The chip consists of a p-type substrate, the one side of which is oxidized to form a film of silicon dioxide, which is an insulator. Then by photolithographic processes, similar to those used in miniature integrated circuits an array of metal electrodes, known as gates, are deposited on the insulator film. This results in the creation of a very large number of tiny MOS capacitors on the entire surface of the chip. The application of small positive potentials to the gate electrodes results in the development of depletion regions just below them. These are called potential wells. The depth of each well (depletion region) varies with the magnitude of the applied potential. As shown in Fig. 6.12 (a), the gate electrodes operate in groups of three, with every third electrode connected to a common conductor. The spots under them serve as light sensitive elements. When any image is focused onto the silicon chip, electrons are generated within it, but very close to the surface. The number of electrons depends on the intensity of incident light. Once produced they collect in the nearby potential wells. As a result the pattern of collected charges represents the optical image.