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Conducting Tip Atomic Force Microscopy (C-AFM) and ITO Surface Treatments
These C-AFM images demonstrate the 15nm electrical heterogeneity of the ITO surface. This lack of uniformity is due to carbonaceous impurities and hydroxide species 0nm contaminating the surface. Additionally it -5 nA is unclear whether the ITO is composed of a single or multiple phases of varying electrical activity. Modification of the ITO surface can increase the electrical activity 0 nA of the film by removing contaminant species and possible changing the relative ratio of phases present on the surface.
Organic
Height Image
ITO In C-AFM a metal-coated cantilever is moved back and forth across a samples surface. The vertical deflection of the cantilever is measured by monitoring the deflection of a laser beam reflected off the back of the cantilever, giving a topographic map of the surface. By applying a voltage to the tip and measuring the current flow we generate corresponding maps of sample topography and electrical properties. It is also possible to obtain current-voltage curves at a single point with an area of ~20 nm2.
Heterogeneity of ITO/CuPc I-V Behavior as a Function of PEDOT:PSS Use and ITO Pretreatment
Detergent Cleaned ITO/CuPc/Pt Tip O2 Plasma Treated ITO/CuPc/Pt Tip 12M HCl-0.2M FeCl3 Etched ITO/CuPc/Pt Tip
1e+8 1e+8 1e+8 1e+7 1e+7 1e+7
(+) Pt
Tip
Treated ITO
1e+6
1e+6
1e+6
1e+5
1e+5
1e+5
CuPc (-)
-0.5 0.0 0.5 1.0
h +
1e+4
1e+4
1e+4
ITO
1e+3 -1000
-500
500
1000
1e+3 -1000
-500
500
1000
1e+3 -1.0
1e+7
1e+6
1e+6
1e+7
1e+7
(+)
Pt Tip h+
1e+6
CuPc
1e+5
1e+5
1e+5
PEDOT
1e+4
1e+4
1e+4
(-)
-1.0 -0.5 0.0 0.5 1.0
ITO
Each semi-log plot on the left shows current-voltage curves at several different ~20 nm2 areas on the same organic film. The data indicate that the electrical heterogeneity of the ITO affects the current flowing through the above Copper Phthalocyanine layer (top row). The addition of a PEDOT:PSS mediator layer (bottom row) makes the electrode electrically uniform by allowing current to pass over any insulating regions on the ITO surface. The PEDOT:PSS/CuPc interface is also rectifying in such a manner as to collect photocurrent and suppress dark current. It should also be noted that the acid etch produces a surface that is already very uniform and is actually hindered by the addition of the PEDOT:PSS layer (right column).
1e+3 -1000
-500
500
1000
1e+3 -1000
ITO
CuPc
C60
Al
ITO/PEDOT:PSS/CuPc/C60/Alq3/Al
Photovoltaic Devices
10
O2 Plasma Treated (Dark) O2 Plasma Treated (Illuminated) Acid Etched (Dark) Acid Etched (Illuminated) Detergent Cleaned (Dark) Detergent Cleaned (Illuminated)
ITO
CuPc
C60
Al
-2
-2
Acid Etched (Dark) Acid Etched (Illuminated) Detergent Cleaned (Dark) Detergent Cleaned (Illuminated)
-5
-5
? 3.8eV 3.8eV
Bias (V)
Detergent Cleaned Oxygen Plasma Acid Etched 4.73 +/- 0.87 6.02 +/- 0.64 5.71 +/- 0.57 0.399 +/- 0.069 0.38 +/- 0.02 0.379 +/- 0.019 0.486 +/- 0.11 0.39 +/- 0.08 0.521 +/- 0.052 0.93 +/- 0.37 0.91+/- 0.3 1.12 +/- 0.14 0.39 +/- 0.8 4 +/- 2.8 0.04 +/- 0.06 3.13 +/- 0.75 3.388e-3 +/- 6e-4 2.09 +/- 0.05
Bias (V)
Detergent Cleaned Oxygen Plasma Isc (mAcm^-2)= 5.69 +/- 0.72 5.9 +/- 0.57 Voc (V)= 0.456 +/- 0.004 0.47 +/- 0.02 FF= 0.37 +/- 0.02 0.34 +/- 0.05 Effieciency (%)= 1.0+/- 0.14 0.9 +/- 0.14 i0 (mAcm^-2) n 0.05 +/- .01 6.3 +/- 0.66 Acid Etched 5.4 +/- 0.4 0.46 +/- 0.01 0.41 +/- 0.01 1.01+/- .06
4.3eV ~4.5eV
4.3eV ~4.5eV
4.3eV
4.3eV
0.02733 +/- 6e-4 0.011 +/- 0.002 4.20 +/- 0.05 3.8 +/- 0.14
6.3eV
6.3eV
The basic equivalent circuit model for a bilayer excitonic solar cell is a light driven current source in parallel with a diode and a shunt resistance, all existing at the donor-acceptor interface. There is another resistance in series with this circuit branch, due to the low conductivities of the transport layers and the resistance associated with carrier injection at the electrical contacts. As shown above, the ITO surface is electrically heterogeneous and so each unit area of the ITO may be thought of as its own photocell, the full solar cell being made up of all the individual area units electrically connected in parallel by the electrodes. Due to its much higher conductivity compared to the transport layers, PEDOT:PSS effectively shunts current over the dead spots in ITO. As long as large areas of the ITO electrode are not insulating, the PEDOT:PSS ameliorates the poor surface properties of ITO, at the expense of adding an additional energy barrier (diode) to the system.
These current voltage curves demonstrate the effect of surface treatment and/or additional PEDOT:PSS layer. The curves on the right (PEDOT:PSS layer) exhibit poor fill factor. This is due to an increase in the diode quality factor (n) relative to the curves on the left (no PEDOT:PSS) caused by the additional energy barrier in series with the Donor-Acceptor interface. PEDOT:PSS increases the short-circuit current of the detergent-cleaned ITO, which suffers the most from electronically inactive regions. For the acid etched ITO and O2 plasma treated ITO the surface is already fairly uniform and the PEDOT essentially does not affect the power conversion efficiency (Voc increase offsets decrease in fill factor). It is also worth noting that the acid etched ITO surfaces uniformity results in significantly improved uniformity from device to device (see width of power conversion efficiency confidence interval, above)
Acknowledgements: The authors would like to thank NSF/STC CMDITR (DMR-0120967) and ONR for their generous financial support