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Process Quality Improvement of a Qualitative Response With Dynamic Characteristic

Predicting Type II Censored Data From Factorial Experiments Using Modified Maximum Likelihood Predictor

Performance Assessment of Processing and Delivery Times for Very Large Scale Integration Using Process Capability Indices

Optimizing Processes Based on Censored Data Obtained in Repetitious Experiments Using Grey Prediction

Optimization of Multi-response Processes Using the VIKOR Method

Optimization of Multiple Responses Using Principal Component Analysis and Technique for Order Preference by Similarity to Ideal Solution

Manufacturing Performance Evaluation for IC Products

Development of a New Cluster Index for Wafer Defects

Process Capability Index and Quality Loss Function